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Automatic alignment and testing system for wafer with ball grid array
Chen, Xinxin, Xiao, Chengdi, Li, Junhui, Tian, Qing, Ge, Dasong, Zhu, WenhuiVolume:
127
Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2016.02.011
Date:
June, 2016
File:
PDF, 2.64 MB
english, 2016