[IEEE 2000 IEEE/SEMI Advanced Semiconductor Manufacturing...

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[IEEE 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop - Boston, MA, USA (12-14 Sept. 2000)] 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072) - A novel method for statistical process control of gate oxide and front-end cleans monitoring in a manufacturing environment

Cosway, R.G., Pirastehfar, L.S., Root, R.P., Roche, T.S., Naujokaitis, J.R.
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Year:
2000
Language:
english
DOI:
10.1109/ASMC.2000.902617
File:
PDF, 433 KB
english, 2000
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