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[IEEE 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - Cairo, Egypt (2015.12.6-2015.12.9)] 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - An evaluation of BTI degradation of 32nm standard cells
Schivittz, Rafael B., Meinhardt, Cristina, Butzen, Paulo F.Year:
2015
Language:
english
DOI:
10.1109/ICECS.2015.7440403
File:
PDF, 270 KB
english, 2015