[IEEE 2016 Joint International EUROSOI Workshop and...

[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - A method for combined characterization of MOSFET threshold voltage and junction capacitance eliminating channel current effect

Tomaszewski, Daniel, Gluszko, Grzegorz, Malesinska, Jolanta

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Year:

2016

Language:

english

DOI:

10.1109/ULIS.2016.7440083

File:

PDF, 1.89 MB

english, 2016

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