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Electron Beam Assisted Extraction of Highly Charged Ions from an ECRIS
Runkel, S., Hohn, O., Schmidt, L., Stiebing, K. E., Schmidt-B?cking, H., Schempp, A., Becker, R.Volume:
T80
Year:
1999
Language:
english
Journal:
Physica Scripta
DOI:
10.1238/physica.topical.080a00507
File:
PDF, 84 KB
english, 1999