Extending resolution of scanning optical microscopy beyond...

Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers

Ding, Chenliang, Wei, Jingsong, Li, Qisong, Liang, Xin, Wei, Tao
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Volume:
41
Language:
english
Journal:
Optics Letters
DOI:
10.1364/OL.41.001550
Date:
April, 2016
File:
PDF, 1.61 MB
english, 2016
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