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Extending resolution of scanning optical microscopy beyond the Abbe limit through the assistance of InSb thin layers
Ding, Chenliang, Wei, Jingsong, Li, Qisong, Liang, Xin, Wei, TaoVolume:
41
Language:
english
Journal:
Optics Letters
DOI:
10.1364/OL.41.001550
Date:
April, 2016
File:
PDF, 1.61 MB
english, 2016