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Experimental characterization and atomistic modeling of interfacial void formation and detachment in short pulse laser processing of metal surfaces covered by solid transparent overlayers
Karim, Eaman T., Shugaev, Maxim V., Wu, Chengping, Lin, Zhibin, Matsumoto, Hisashi, Conneran, Maria, Kleinert, Jan, Hainsey, Robert F., Zhigilei, Leonid V.Volume:
122
Language:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-016-9944-7
Date:
April, 2016
File:
PDF, 4.54 MB
english, 2016