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Interface trap generation in MOS structures by high-energy electron irradiation
Halova, E, Alexandrova, S, Kaschieva, S, Dmitriev, S NVolume:
253
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/253/1/012047
Date:
November, 2010
File:
PDF, 689 KB
english, 2010