[IEEE 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - Cairo, Egypt (2015.12.6-2015.12.9)] 2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) - Efficiency analysis of importance sampling in deep submicron STT-RAM design using uncontrollable industry-compatible model parameter
Na, Taehui, Jeong, Hanwool, Jung, Seong-Ook, Kim, Jung Pill, Kang, Seung H.Year:
2015
Language:
english
DOI:
10.1109/ICECS.2015.7440333
File:
PDF, 298 KB
english, 2015