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Re-trapping and cooling of highly-charged ions
Hobein, M, Solders, A, Suhonen, M, Liu, Y, Kamalou, O, Schuch, RVolume:
163
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/163/1/012109
Date:
April, 2009
File:
PDF, 1.19 MB
english, 2009