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Misfit dislocations at the CoSi 2 /Si (001) interface studied by aberration-corrected high angle annular darkfield imaging
Falke, Meiken, Falke, Uwe, Bleloch, AndrewVolume:
26
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/26/1/005
Date:
February, 2006
File:
PDF, 3.20 MB
english, 2006