![](/img/cover-not-exists.png)
[IEEE 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) - Oxford, United Kingdom (2015.9.7-2015.9.12)] 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) - Measuring chromatic aberration in imaging systems using plasmonic nano-particles
Gennaro, Sylvain D., Roschuk, Tyler R., Maier, Stefan. A., Oulton, Rupert F.Year:
2015
Language:
english
DOI:
10.1109/MetaMaterials.2015.7342467
File:
PDF, 303 KB
english, 2015