[IEEE 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Kolkata, India (2016.1.4-2016.1.8)] 2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) - Test Time Minimisation in Scan Compression Designs Using Dynamic Channel Allocation
Abraham, Jais, Umapathi, Shankar, Krishnamurthi, SumithaYear:
2016
Language:
english
DOI:
10.1109/VLSID.2016.99
File:
PDF, 225 KB
english, 2016