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Lumen maintenance predictions for LED packages
van Driel, W.D., Schuld, M., Jacobs, B., Commissaris, F., van der Eyden, J., Hamon, B.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.03.018
Date:
March, 2016
File:
PDF, 1.84 MB
english, 2016