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Raman and ellipsometry spectroscopic analysis of graphene films grown directly on Si substrate via CVD technique for estimating the graphene atomic planes number
Al-Hazmi, F.S., Beall, Gary W., Al-Ghamdi, A.A., Alshahrie, Ahmed, Shokr, F.S., Mahmoud, Waleed E.Language:
english
Journal:
Journal of Molecular Structure
DOI:
10.1016/j.molstruc.2016.04.028
Date:
April, 2016
File:
PDF, 1.84 MB
english, 2016