Electron probe microanalysis on electron microscope thin foils using thin standards
Philibert, J, Rivory, J, Bryckaert, D, Tixier, RVolume:
4
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/4/4/520
Date:
April, 1971
File:
PDF, 34 KB
1971