Analysis of improvement in performance and design...

Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope

Yoon, Yeo Hun, Kim, Seung Jae, Kim, Dong Hwan
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Volume:
64
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfv052
Date:
December, 2015
File:
PDF, 533 KB
english, 2015
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