Analysis of improvement in performance and design parameters for enhancing resolution in an atmospheric scanning electron microscope
Yoon, Yeo Hun, Kim, Seung Jae, Kim, Dong HwanVolume:
64
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfv052
Date:
December, 2015
File:
PDF, 533 KB
english, 2015