Application of the local effect model to predict DNA double-strand break rejoining after photon and high-LET irradiation
Tommasino, F., Friedrich, T., Scholz, U., Taucher-Scholz, G., Durante, M., Scholz, M.Volume:
166
Language:
english
Journal:
Radiation Protection Dosimetry
DOI:
10.1093/rpd/ncv164
Date:
September, 2015
File:
PDF, 179 KB
english, 2015