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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Reflection, Scattering, and Diffraction from Surfaces III - Reflectance variability of surface coatings reveals characteristic eigenvalue spectra
Medina, José M., Díaz, José A., Barros, Rui, Hanssen, Leonard M.Volume:
8495
Year:
2012
Language:
english
DOI:
10.1117/12.929926
File:
PDF, 1.08 MB
english, 2012