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Comments on "Researcher Bias: The Use of Machine Learning in Software Defect Prediction"
Tantithamthavorn, Chakkrit, McIntosh, Shane, Hassan, Ahmed E., Matsumoto, KenichiYear:
2016
Language:
english
Journal:
IEEE Transactions on Software Engineering
DOI:
10.1109/TSE.2016.2553030
File:
PDF, 383 KB
english, 2016