Atom probe tomography of compositional fluctuation in GaInN layers
Kanitani, Yuya, Tanaka, Shinji, Tomiya, Shigetaka, Ohkubo, Tadakatsu, Hono, KazuhiroVolume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.05FM04
Date:
May, 2016
File:
PDF, 933 KB
english, 2016