Atom probe tomography of compositional fluctuation in GaInN...

Atom probe tomography of compositional fluctuation in GaInN layers

Kanitani, Yuya, Tanaka, Shinji, Tomiya, Shigetaka, Ohkubo, Tadakatsu, Hono, Kazuhiro
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Volume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.05FM04
Date:
May, 2016
File:
PDF, 933 KB
english, 2016
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