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Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection
Janssens, Eline, Alves Pereira, Luis F., De Beenhouwer, Jan, Tsang, Ing Ren, Van Dael, Mattias, Verboven, Pieter, Nicolaï, Bart, Sijbers, JanLanguage:
english
Journal:
Case Studies in Nondestructive Testing and Evaluation
DOI:
10.1016/j.csndt.2016.03.003
Date:
March, 2016
File:
PDF, 939 KB
english, 2016