Accelerated lifetime test based on general electrical...

Organic Electronics 2016 / 07 Vol. 34

Accelerated lifetime test based on general electrical principles for light-emitting electrochemical cells

Jang, Jin Hyuk, Kim, Lae Ho, Jeong, Yong Jin, Kim, Kyunghun, An, Tae Kyu, Kim, Se Hyun, Park, Chan Eon
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Volume:
34
Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2016.04.003
Date:
July, 2016
File:
PDF, 616 KB
english, 2016
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