SPIE Proceedings [SPIE SPIE Sensing Technology +...

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SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Image Sensing Technologies: Materials, Devices, Systems, and Applications - A 33-mpixel 120-fps CMOS image sensor using 0.11-μm CIS process

Dhar, Nibir K., Dutta, Achyut K., Yasue, Toshio, Hayashida, Tetsuya, Yonai, Jun, Kitamura, Kazuya, Watabe, Toshihisa, Ootake, Hiroshi, Shimamoto, Hiroshi, Kosugi, Tomohiko, Watanabe, Takashi, Aoyama,
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Volume:
9100
Year:
2014
Language:
english
DOI:
10.1117/12.2049145
File:
PDF, 490 KB
english, 2014
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