A two-level approximate model driven framework for...

Microelectronics Journal 2016 / 02 Vol. 48

A two-level approximate model driven framework for characterizing Multi-Cell Upsets impacts on processors

Jiao, Jiajia, Marculescu, Diana, Juan, Da-Cheng, Fu, Yuzhuo
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Volume:
48
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2015.11.011
Date:
February, 2016
File:
PDF, 1.64 MB
english, 2016
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