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Diffraction stress analysis of highly planar-faulted, macroscopically elastically anisotropic thin films and application to tensilely loaded nanocrystalline Ni and Ni(W)
Kurz, Silke Julia Birgit, Welzel, Udo, Bischoff, Ewald, Mittemeijer, Eric JanVolume:
47
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576713030756
Date:
February, 2014
File:
PDF, 1.14 MB
english, 2014