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Comparison of Three E-Beam Techniques for Electric Field Imaging and Carrier Diffusion Length Measurement on the Same Nanowires
Donatini, F., de Luna Bugallo, Andres, Tchoulfian, Pierre, Chicot, Gauthier, Sartel, Corinne, Sallet, Vincent, Pernot, JulienLanguage:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.5b04710
Date:
April, 2016
File:
PDF, 4.00 MB
english, 2016