Identification of extended defect and interface related...

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  • Identification of extended defect and interface related...

Identification of extended defect and interface related luminescence lines in polycrystalline ZnO thin films grown by sol-gel process

Guillemin, Sophie, Consonni, Vincent, Rapenne, Laetitia, Sarigiannidou, Eirini, Donatini, Fabrice, Bremond, Georges
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Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/C6RA04634G
File:
PDF, 1.48 MB
english, 2016
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