Global Parameterization of Multiple Point-Defect Dynamics...

Journal of The Electrochemical Society 2003 Vol. 150; Iss. 11

Global Parameterization of Multiple Point-Defect Dynamics Models in Silicon

Frewen, Thomas A., Sinno, Talid, Dornberger, Erich, Hoelzl, Robert, von Ammon, Wilfried, Bracht, Hartmut
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Volume:
150
Year:
2003
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1610470
File:
PDF, 341 KB
english, 2003
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