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[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - A new extraction method of parasitic resistance for poly-connected MOSFETs
Ye, Haohua, Tseng, Chien-Lung, Lian, BowenYear:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7463902
File:
PDF, 420 KB
english, 2016