![](/img/cover-not-exists.png)
[IEEE 2016 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2016.3.13-2016.3.14)] 2016 China Semiconductor Technology International Conference (CSTIC) - Analysis of short channel effects for 14nm and beyond Si-bulk FinFET
Yang, Xiaolei, Li, Yong, Xie, Xinyun, Zhang, Shuai, Shen, Zhaoxu, Zhou, Fei, He, Xin, Zhao, Jie, Mao, Gang, Wang, Anni, Ju, JianhuaYear:
2016
Language:
english
DOI:
10.1109/CSTIC.2016.7464044
File:
PDF, 290 KB
english, 2016