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Determining the thermal stress limit of LED lamps using highly accelerated decay testing
Cai, Miao, Yang, Daoguo, Mo, Yuezhu, Huang, Jianlin, Yin, Luqiao, Yang, Lianqiao, Chen, Xianping, Chen, Wenbin, Zhang, GuoqiVolume:
102
Language:
english
Journal:
Applied Thermal Engineering
DOI:
10.1016/j.applthermaleng.2016.04.012
Date:
June, 2016
File:
PDF, 2.41 MB
english, 2016