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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Sunday 3 April 2016)] Optics, Photonics and Digital Technologies for Imaging Applications IV - Texel-based image classification with orthogonal bases
Schelkens, Peter, Ebrahimi, Touradj, Cristóbal, Gabriel, Truchetet, Frédéric, Saarikko, Pasi, Carbajal-Degante, Erik, Nava, Rodrigo, Olveres, Jimena, Escalante-Ramírez, Boris, Kybic, JanVolume:
9896
Year:
2016
Language:
english
DOI:
10.1117/12.2228694
File:
PDF, 976 KB
english, 2016