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Investigation of failure mechanisms in silicon based half cells during the first cycle by micro X-ray tomography and radiography
Sun, Fu, Markötter, Henning, Dong, Kang, Manke, Ingo, Hilger, Andre, Kardjilov, Nikolay, Banhart, JohnVolume:
321
Language:
english
Journal:
Journal of Power Sources
DOI:
10.1016/j.jpowsour.2016.04.126
Date:
July, 2016
File:
PDF, 2.95 MB
english, 2016