Simple method for extracting the difference between the drain and source series resistances in MOSFETs
Ortiz-Conde, A., Wong, W., Liou, J.J., García Sánchez, F.J.Volume:
30
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19940681
Date:
June, 1994
File:
PDF, 223 KB
english, 1994