Optimization of Boundary Scan Tests Using FPGA-Based...

Journal of Electronic Testing 2016 / 6 Vol. 32; Iss. 3

Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures

Aleksejev, Igor, Devadze, Sergei, Jutman, Artur, Shibin, Konstantin
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Volume:
32
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-016-5588-y
Date:
June, 2016
File:
PDF, 567 KB
english, 2016
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