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Computers & Industrial Engineering 2016 / 5

Manufacturing Intelligence for Reducing False Alarm of Defect Classification by Integrating Similarity Matching Approach in CMOS Image Sensor Manufacturing

Chen, Ying-Jen, Fan, Chu-Yuan, Chang, Kuo-Hao, Chien, Chen-Fu
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Language:
english
Journal:
Computers & Industrial Engineering
DOI:
10.1016/j.cie.2016.05.009
Date:
May, 2016
File:
PDF, 1006 KB
english, 2016
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