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[IEEE 2015 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2015.10.11-2015.10.15)] 2015 IEEE International Integrated Reliability Workshop (IIRW) - Polysilicon resistor degradation - modeling and mechanism
Jayanarayanan, SankaranYear:
2015
Language:
english
DOI:
10.1109/IIRW.2015.7437080
File:
PDF, 732 KB
english, 2015