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Optical inspection of smartphone camera modules by near-infrared low-coherence interferometry
Lee, Chang-Yun, Hyun, Sang-Won, Kim, Young-Jin, Kim, Seung-WooVolume:
55
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.oe.55.9.091404
Date:
March, 2016
File:
PDF, 1.98 MB
english, 2016