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[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Software in a hardware view: New models for HW-dependent software in SoC verification and test
Villarraga, Carlos, Schmidt, Bernard, Bao, Binghao, Raman, Rakesh, Bartsch, Christian, Fehmel, Thomas, Stoffel, Dominik, Kunz, WolfgangYear:
2014
Language:
english
DOI:
10.1109/TEST.2014.7035308
File:
PDF, 300 KB
english, 2014