ASAP7: A 7-nm finFET predictive process design kit

Microelectronics Journal 2016 / 07 Vol. 53

ASAP7: A 7-nm finFET predictive process design kit

Clark, Lawrence T., Vashishtha, Vinay, Shifren, Lucian, Gujja, Aditya, Sinha, Saurabh, Cline, Brian, Ramamurthy, Chandarasekaran, Yeric, Greg
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Volume:
53
Language:
english
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2016.04.006
Date:
July, 2016
File:
PDF, 2.91 MB
english, 2016
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