Gamma irradiation-induced effects on the electrical properties of HfO 2 -based MOS devices
Manikanthababu, N., Arun, N., Dhanunjaya, M., Nageswara Rao, S.V.S., Pathak, A. P.Volume:
171
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420150.2015.1135152
Date:
February, 2016
File:
PDF, 1.59 MB
english, 2016