[IEEE 2016 Annual Reliability and Maintainability Symposium (RAMS) - Tucson, AZ, USA (2016.1.25-2016.1.28)] 2016 Annual Reliability and Maintainability Symposium (RAMS) - Remaining useful life prognostics using pattern-based machine learning
Ragab, Ahmed, Yacout, Soumaya, Ouali, Mohamed-SalahYear:
2016
Language:
english
DOI:
10.1109/rams.2016.7448025
File:
PDF, 285 KB
english, 2016