SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Multimedia Content and Mobile Devices - Multiple-field approach for aberration correction in miniature imaging systems based on wafer-level production
Logean, Eric, Scharf, Toralf, Bongard, Nicolas, Herzig, Hans Peter, Rossi, Markus, Snoek, Cees G. M., Kennedy, Lyndon S., Creutzburg, Reiner, Akopian, David, Wüller, Dietmar, Matherson, Kevin J., GeorVolume:
8667
Year:
2013
Language:
english
DOI:
10.1117/12.2004390
File:
PDF, 1.09 MB
english, 2013