Detection of defects on the surface of a semiconductor by...

Applied Optics 2016 / 05 Vol. 55; Iss. 15

Detection of defects on the surface of a semiconductor by terahertz surface plasmon polaritons

Yang, Tao, Li, Yuanyi, Stantchev, Rayko, Zhu, Yongyuan, Qin, Yiqiang, Zhou, Xinhui, Huang, Wei
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Volume:
55
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.55.004139
Date:
May, 2016
File:
PDF, 711 KB
english, 2016
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