Correlative Fractography: Combining Scanning Electron...

Microscopy and Microanalysis 2013 / 4 Vol. 19; Iss. 2

Correlative Fractography: Combining Scanning Electron Microscopy and Light Microscopes for Qualitative and Quantitative Analysis of Fracture Surfaces

Hein, Luis Rogerio de Oliveira, de Oliveira, José Alberto, de Campos, Kamila Amato
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Volume:
19
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927612014249
Date:
April, 2013
File:
PDF, 685 KB
english, 2013
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