Confirmation of the new technique for measuring the linear...

Powder Diffraction 1993 / 3 Vol. 8; Iss. 1

Confirmation of the new technique for measuring the linear thermal expansion of silicon

Fengchao, Liu
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Volume:
8
Language:
english
Journal:
Powder Diffraction
DOI:
10.1017/s0885715600017711
Date:
March, 1993
File:
PDF, 244 KB
english, 1993
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