Transmission Electron Microscopy Study of FeHfN Thin Films...

Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.

Pantel, R, Couderc, S, Ancey, P, Wyon, C, Viala, B
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Volume:
11
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927605501922
Date:
August, 2005
File:
PDF, 250 KB
english, 2005
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