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Cold Sample Preparation for Cross-sectional Transmission Electron Microscopy: Cu Nanocrystals Embedded in 2 [mu]m SiO2 films
Johannessen, B, Llewellyn, DJ, Kluth, P, Ridgway, MCVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606063082
Date:
August, 2006
File:
PDF, 273 KB
english, 2006