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Spectral Imaging and Multivariate Statistical Analysis from Thin Specimens in the SEM with a Four-Channel Silicon Drift Detector
Kotula, PG, Michael, JRVolume:
12
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927606066955
Date:
August, 2006
File:
PDF, 284 KB
english, 2006